Takuji Hosoi
Takato Nakanuma
Asato Suzuki
Yu Iwakata
Takuma Kobayashi
Mitsuru Sometani
Mitsuo Okamoto
Takuji Hosoi
Takayoshi Shimura
Heiji Watanabe
Investigation of reliability of NO nitrided SiC(1100) MOS devices.
3
2022
IRPS
https://doi.org/10.1109/IRPS48227.2022.9764595
conf/irps/2022
db/conf/irps/irps2022.html#NakanumaSIKSOHS22
Yutaka Terao
Takuji Hosoi
Takuma Kobayashi
Takayoshi Shimura
Heiji Watanabe
Characterization of Electron Traps in Gate Oxide of m-plane SiC MOS Capacitors.
66-1
2022
IRPS
https://doi.org/10.1109/IRPS48227.2022.9764433
conf/irps/2022
db/conf/irps/irps2022.html#TeraoHKSW22
Nguyen Hoai Ngo
Anh Quang Nguyen
Fabian M. Bufler
Yoshinari Kamakura
Hideki Mutoh
Takayoshi Shimura
Takuji Hosoi
Heiji Watanabe
Philippe Matagne
Kazuhiro Shimonomura
Kohsei Takehara
Edoardo Charbon
Takeharu Goji Etoh
Toward the Super Temporal Resolution Image Sensor with a Germanium Photodiode for Visible Light.
6895
2020
20
Sensors
23
https://doi.org/10.3390/s20236895
https://www.wikidata.org/entity/Q104071744
db/journals/sensors/sensors20.html#NgoNBKMSHWMSTCE20
Fabian M. Bufler
Edoardo Charbon
Takeharu Goji Etoh
Yu Iwakata
Yoshinari Kamakura
Takuma Kobayashi
Philippe Matagne
Hideki Mutoh
Takato Nakanuma
Nguyen Hoai Ngo
Anh Quang Nguyen
Mitsuo Okamoto
Kazuhiro Shimonomura
Takayoshi Shimura
Mitsuru Sometani
Asato Suzuki
Kohsei Takehara
Yutaka Terao
Heiji Watanabe